Built with a sealed-tube x-ray source, Gobel mirror monochromator,
Huber four-circle goniometer, and a low noise scintillation
detector, this custom integrated instrument is designed
for x-ray reflectivity and wide angle diffraction measurements
on thin film and powder samples. Applications include
thin film metrology (thickness and rough powerness, rocking
curve), material and phase identification, texture (pole
figure) measurements, and x-ray crystallography.
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