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Forvis Technologies, Inc. specializes in providing custom designed cutting edge analytical solutions for small and wide angle x-ray scattering (SAXS/WAXS), powder diffraction and thin film reflectometry for characterizating the nanoscale structure of materials in the range spanning 0.1 nm-100 nm.

Forvis has delivered solutions to researchers worldwide engaged in advanced studies of biological, polymeric, electronic and nanostructured materials. We offer a wide range of services including complete turn-key systems, highly customized designs based on specific end-user requirements, system integration services, x-ray detectors, environmental sample chambers, and x-ray optical components.

At Forvis, finding the right solution for our customers is our main focus. Contact us to find out how we can put our experience to work for you.

 

Copyright Forvis Technologies Inc.
E-mail: info@forvis.com       California, USA       Phone: (805) 618-1746       Fax: (805) 456-4499