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Forvis Technologies, Inc. specializes in the design and construction of custom x-ray diffraction instrumentation, providing cutting edge analytical solutions for small angle x-ray scattering (SAXS), powder diffraction, thin film reflectometry, and x-ray crystallography.

These tools provide the unique capability to characterize the nanoscale structure of materials in the range spanning 0.1 nm-100 nm, which are essential to meeting the challenges of the emerging nanoscience and nanotechnology. Forvis products are currently employed by researchers worldwide engaged in advanced studies of biological, polymeric, electronic and nanostructured materials.

We offer a wide range of products including complete turn-key systems, highly customized solutions based on specific end-user requirements, system integration services, x-ray detectors, environmental sample chambers, and x-ray optical components.

At Forvis, finding the right solution for our customers is our main focus. Contact us to find out how we can put our experience to work for you.

Copyright Forvis Technologies Inc.
E-mail: info@forvis.com Phone: (805) 252-6315 Fax: (805) 456-4499